Methods of Determining Operating Conditions of Silicon Carbide Power MOSFET Devices Associated with Aging, Related Circuits and Computer Program Products
Inventors
- Bilal Akin (UT/Dallas)
- Shi Pu (UT/Dallas)
- Fei Yang (UT/Dallas)
Related Patents
Condition Monitoring System and Method for Power MOSFETs
Bilal Akin (UT/Dallas); Shi Pu (UT/Dallas); Fei Yang (UT/Dallas)Patent Application Expired
Application Type: Provisional