-
New soft error analysis techniques for sequential circuits achieve 25X runtime reduction over current methods.
CADT Featured Publication: Report on a Combinational Soft Error Simulator with Full Fault Front Propagation Capabilities
Featured Publication
-
Minimum 4X reduction in energy-performance product achieved on designs from multiple domains through new relative timed methods.
CADT Featured Publication: Final Report on Low Power Modular 4G Asynchronous System on Chip
Featured Publication
-
2016 Karecki Award Presented to Xiangyu Bi, AZ State
At its annual meeting, the Engineering Research Center for Environmentally Benign Semiconductor Manufacturing presented the 2016 Simon Karecki Award to an ASU researcher.
SRC In The News
-
Integrated CMOS transmitter detects acetone, methanol, and ethanol in human breath through rotational spectroscopy.
AMS-CSD Featured Publication: Report on a Demonstration of Transmitter in a Spectrometer
Featured Publication
-
With epitaxial III-Sb p-type FET, record-high MOSFET drain currents were demonstrated for both GaAs and Si substrates.
LMD Featured Publication: Report on Technologies and Electrical Parameters of Test MOSFETs and FinFETs Fabricated on Metamorphic Buffer
Featured Publication
-
TECHCON 2016 Call for Abstracts - Now Open
The deadline for TECHCON 2016 abstract submissions is 3:00 p.m. ET, April 13, 2016.
Article
-
Calls for Nominations for 2016 SRC Awards Now Open
The Call for Nominations for the 2016 Aristotle Award, Technical Excellence Award, and the Mahboob Khan Outstanding Liaison Awards are now open. Nominations for all calls are due by Wednesday, April 29, 2016. Please see each Call for Nominations for complete information, criteria and nomination forms.
Article
-
Former Intel CEO Passes Away
Intel's Andrew Grove passed away March 21, 2016 at the age of 79. He played a very influential part at our largest member company and was a strong supporter of SRC.
Article
-
SRC Student Wins 2015 EDAA Outstanding Dissertation Award
Congratulations to David Lin of Stanford University, an SRC-supported student of Professor Subhasish Mitra, who has won the 2015 EDAA Outstanding Dissertation Award for his thesis “QED Post-Silicon Validation and Debug”.
Article
-
Running Out Of Energy?
Semiconductor Engineering story quotes Celia Merzbacher discussing the topic of energy efficient computing.
SRC In The News
-
SRC Professor Named Hans Fischer Senior Research Fellow at the Technical University of Munich
Krishnendu Chakrabarty, the William H. Younger Professor of Engineering in Duke University’s Department of Electrical and Computer Engineering, received the three-year fellowship which includes up to $180,000 and support for a graduate student to pursue research activities while furthering collaborative research ties with the university.
Article
-
SRC Professor Pradeep Lall Receives the Wright Gardner Award from the Alabama Academy of Science
Professor Lall serves as director of Auburn’s NSF-CAVE3 Electronics Research, which is dedicated to working with industry to develop and implement new technologies for the packaging and manufacturing of electronics. He also leads a national manufacturing effort on harsh environment electronics established at Auburn as part of a U.S. Department of Defense-led flexible hybrid electronics institute called NextFlex. Prof. Lall has been funded by the GRC Packaging thrust for many years and has produced many breakthrough research results.
Article
-
Developed by etchless techniques via block copolymers, tungsten oxide nanowires were shown highly crystalline.
NMP Featured Publication: Report on the Delivery of Aligned Tungsten and Tungsten Oxide Nanowires using Etchless BCP Method and Electrical Characterization
Featured Publication
-
An architecture using multifunctional memory demonstrates 8 orders of magnitude better energy-delay product compared to CPU’s.
EP3C Featured Publication: Report on the Design Methodologies for Malleable Memory Array Inside PE Including Realization of LUTs and Synaptic Computing Fabric
Featured Publication
-
TxACE shows power supply instability during turn-on ESD event and gives guidelines to redesign the active rail clamp circuits.
AMS-CSD Featured Publication: Measurement Results for New Rail Clamp Designs
Featured Publication
- Newsroom
-
Looking for our newsletter? Want to submit your own news? Read and subscribe here .
